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Brand Name : | ZMSH |
Model Number : | SI WAFER |
Certification : | ROHS |
Price : | by quantites |
Payment Terms : | Western Union, T/T |
Delivery Time : | 2-4weeks |
SapphiLarge Thickness Thermal Oxide (SiO2) On Silicon Wafers For Optical Communication System
Generally, the oxide layer thickness of silicon wafers is mainly concentrated below 3um, and the countries and regions that can stably produce high-quality thick oxide layer (above 3um) silicon wafers are still dominated by the United States, Japan, South Korea and Taiwan, China. This project aims to break through the film forming efficiency, film thickness limit and film forming quality of oxide film (SiO) under the current oxide layer growth process, and produce a maximum of 25um(+5%) ultra-thick oxide layer silicon wafer with high quality and high efficiency in a relatively short time. In-plane and inter-plane uniformity +0.5%, refractive index of 1550nm 1.4458+0.0001. Make a contribution to the localization of 5G and optical communication.
Silicon wafers form silica layers through furnace tubes in the presence of oxidizing agents at elevated temperatures, a process known as thermal oxidation. The temperature range is controlled from 900 to 1,250℃; The ratio of the oxidizing gas H2:O2 is between 1.5:1 and 3:1. According to the size of the silicon wafer, there will be different flow loss without oxidation thickness. The substrate silicon wafer is 6 "or 8" monocrystalline silicon with an oxide layer thickness of 0.1μm to 25μm.
Items | Specification |
Layer Thickness | 20um士5% |
Uniformity ( within a wafer) | 土0.5% |
Uniformity (between wafers) | 土0.5% |
Refractive Index (@1550nm) | 1.4458+0.0001 |
Particle | ≤50Measured Average <10 |
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